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QCM/Reflectance Analysis of Polymer Dissolution Kinetics
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We have established experimental techniques for polymer dissolution that can provide insight into details
of the dissolution process1-3. Our experimental protocol for characterizing polymer thin film
dissolution combines high-sensitivity gravimetric analysis using a quartz crystal microbalance (QCM) with
an analysis of film depth structure by visible and infrared reflectance spectroscopy (see figure below). These
techniques provide complementary information about the time evolution of the film undergoing dissolution.
From such measurements a detailed picture can be constructed of the chemical and physical changes that
comprise the dissolution process.
A simple example is shown below. The dissolving film is the copolymer poly(methyl
methacrylate-co-methacrylic acid), a model for a 193 nm photoresist. When dissolved by an aqueous solution
of hydroxide ion, an initial swollen interfacial layer is formed, with a net increase in film mass
detected by QCM and characteristic changes in the reflectance spectrum of the film. The thickness and
rate of formation of the interfacial layer depends on the hydroxide concentration. Both the rate of
formation and the composition of the swollen layer are available from the measurements. Swelling is
followed by dissolution of the film in a linear manner while the thickness of the interfacial layer
remains constant. Mechanistic information can be inferred from such data; in this instance, it can be
shown that the dissolution process is controlled by the rate of diffusion of hydroxide ion through the
interfacial layer.
References
- S. Lee, W. Hinsberg and K. Kanazawa, Anal. Chem., 74, 125-131 (2002).
- F. Houle, W. Hinsberg and M. Sanchez, Macromolecules, 35, 3591-3600 (2002).
- W. Hinsberg, F.A. Houle, S-W Lee H. Ito and K. Kanazawa, Macromolecules, 38, 1882-1898 (2005).
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| QCM/Reflectance Analysis of Polymer Dissolution Kinetics
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| Kinetic Model for Resist Polymer Dissolution
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| | Teas Solubility Parameter Map
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