IBM®
Skip to main content
    United States [change]    Terms of use
 
 
 
    Home    Products    Services & solutions    Support & downloads    My account    
IBM Research

STM/AFM Instrument Design

STM/AFM Instrument Design
At the heart of the instrument, a tip is mounted on a tuning-fork similar to the one found in wrist-watches.

STM/AFM Instrument Design
The tuning fork is mounted on a scanner to position the tip in all directions by piezo motors.

The STM/AFM force detection
The tuning fork acts like a mass connected to a spring and oscillates at its resonance frequency which can be disturbed by a force gradient.

Simultaneous G(z) and delta f(z) measurement
The very small oscillation amplitude allows detecting the frequency shift and the tunneling conductance simultaneously.

Distance dependence of the conductance
The conductance increases exponentially until it saturates into the point contact regime.

Background forces and forces to the adsorbate
Background forces and forces between tip and adsorbate can be discriminated.

Vertical force and interaction energy
The vertical force and the potential can be determined from the cantilever frequency shift.

Force images and atomic resolution
Simultaneously recorded atomic resolution on CuN in the STM (current) and the AFM (force) channel.

Force images and atomic resolution
The forces measured on CuN depend on the atom below the tip and its environment.






  

Click for More Information
Link to Instrument Design
The STM/AFM Instrument
Link to Atomic Movement Force
The Force to Move an Atom
Link to force symmetry
Short-Range Force Symmetry
Link to CO on Cu
CO on Cu
Link to 2D potential maps
2D Potential Maps


    About IBMPrivacyContact