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Almaden Research Center
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Auger electron spectroscopy
Nuclear Magnetic Resonance
Secondary Electron Microscopy
Thermal Analysis
X-ray Photoelectron Spectroscopy
Ion Beam Surface Analysis
The ion beams laboratory at Almaden uses a 3.6 MeV Pelletron to generate ion beams for the following types of thin-film analysis:
Rutherford backscattering spectrometry (RBS)
Forward recoil spectrometry (FRS)
Particle induced X-ray emission (PIXE)
Nuclear resonance analysis (NRA)
Techniques
Auger Electron Spectroscopy
Field Emission Transmission Electron Microscopy
Focussed Ion Beam (FIB)
Ion Beam Surface Analysis
Nuclear Magnetic Resonance (NMR) analysis
Scanning Electron Microscopy (SEM)
Scanning Probe Laboratory
Secondary Ion Mass Spectroscopy (SIMS)
Specular X-ray Reflectivity
Thermal Analysis
X-ray Diffraction
X-ray Photoelectron Spectroscopy (XPS)
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