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Scanning Electron Microscopy
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Scanning electron microscopy, SEM, is used to examine physical features with dimensions from several microns down to a few nanometers. First developed in the 1930s, SEM utilizes a densely focused beam of electrons, 2 to 30 keV, that is rastered over the examination area. Secondary electrons emitted from the surface are detected and in synchronization with the raster, their intensity is displayed on a monitor.
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