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X-ray Diffraction
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X-ray Diffraction (Bruker system: D8 Discover with GADDS)
X-ray diffraction (XRD) is a well-established powerful tool for accurate identification of crystalline
or micro-crystalline materials. Our high resolution XRD system is optimally configured for rapid
structural characterization of thin films. The system illuminates the sample with monochromatic (Cu
K-alpha) and collimated x-ray beam. The intensity of the spatially diffracted x-rays is measured by a high
performance area detector. This detector offers a wide solid angle for data collection and also has unique
ability of counting even a single x-ray photon. The system is equipped with a Laser-Video alignment
system for easy mounting of a sample in the diffractometer and hence allows for rapid change of samples.
Figure included below shows a typical XRD scan from a thin film sample and the result shown is spatial
intensity distribution of diffracted x-rays as seen by the area detector.
Perfectly polycrystalline films yield circular rings of uniform intensity. The observed pattern shows arcs
indicating highly oriented sample. The position of the arcs/rings can be used to identify the material and
its orientation.
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